http://www.cnr.it/ontology/cnr/individuo/prodotto/ID171141
Calcium Copper-Titanate Thin Film Growth: Tailoring of the Operational Conditions through Nanocharacterization and Substrate Nature Effects (Articolo in rivista)
- Type
- Label
- Calcium Copper-Titanate Thin Film Growth: Tailoring of the Operational Conditions through Nanocharacterization and Substrate Nature Effects (Articolo in rivista) (literal)
- Anno
- 2006-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1021/jp062559c (literal)
- Alternative label
Lo Nigro R, Toro RG, Malandrino G, Fragala IL, Losurdo M, Giangregorio MM, Bruno G, Raineri V, Fiorenza P (2006)
Calcium Copper-Titanate Thin Film Growth: Tailoring of the Operational Conditions through Nanocharacterization and Substrate Nature Effects
in The journal of physical chemistry. B
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Lo Nigro R, Toro RG, Malandrino G, Fragala IL, Losurdo M, Giangregorio MM, Bruno G, Raineri V, Fiorenza P (literal)
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- Pagina fine
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- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR, Inst Microelect & Microsyst, I-95121 Catania, Italy; Catania Univ, Dipartimento Sci Chim, INSTM UdR Catania, I-85125 Catania, Italy; CNR, IMIP, Inst Inorgan Methodol & Plasmas, I-70125 Bari, Italy; INST UdR, I-70125 Bari, Italy (literal)
- Titolo
- Calcium Copper-Titanate Thin Film Growth: Tailoring of the Operational Conditions through Nanocharacterization and Substrate Nature Effects (literal)
- Abstract
- A novel approach based on a molten multicomponent precursor source has been applied for the MOCVD fabrication of high-quality CaCu3Ti4O12 (CCTO) thin films on various substrates. The adopted in situ strategy involves a molten mixture consisting of Ca(hfa)(2)center dot tetraglyme, Ti(tmhd)(2)(O-iPr)(2), and Cu(tmhd)(2)[Hhfa = 1,1,1,5,5,5-hexafluoro-2,4-pentanedione; tetraglyme) 2,5,8,11,14-pentaoxapentadecane; Htmhd = 2,2,6,6-tetramethyl- 3,5-heptandione; O-iPr) isopropoxide] precursors. Film structural and morphological characterizations have been carried out by several techniques [X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM)], and in particular the energy filtered TEM mapping and X-ray energy dispersive (EDX) analysis in TEM mode provided a suitable correlation between nanostructural properties of CCTO films and deposition conditions and/or the substrate nature. Correlation between the nanostructure and optical/dielectric properties has been investigated exploiting spectroscopic ellipsometry. (literal)
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