http://www.cnr.it/ontology/cnr/individuo/prodotto/ID170917
Electron beam deposited VC and NbC thin films on titanium: hardness and energy-dispersive X-ray diffraction study (Articolo in rivista)
- Type
- Label
- Electron beam deposited VC and NbC thin films on titanium: hardness and energy-dispersive X-ray diffraction study (Articolo in rivista) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Alternative label
Ferro D., Rau J.V., Generosi A., Rossi Albertini, V., Latini A., Barinov S.M. (2008)
Electron beam deposited VC and NbC thin films on titanium: hardness and energy-dispersive X-ray diffraction study
in Surface & coatings technology
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Ferro D., Rau J.V., Generosi A., Rossi Albertini, V., Latini A., Barinov S.M. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
- http://dx.doi.org/10.1016/j.surfcoat.2007.09.008 (literal)
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Russian Acad Sci, Inst Phys Chem Ceram, Moscow 119361, Russia
CNR, Ist Studio Mat Nanostrutturat, I-00185 Rome, Italy
CNR, Ist Struttura Mat, I-00133 Rome, Italy
Univ Roma La Sapienza, Dipartimento Chim, I-00185 Rome, Italy (literal)
- Titolo
- Electron beam deposited VC and NbC thin films on titanium: hardness and energy-dispersive X-ray diffraction study (literal)
- Abstract
- Films of VC and NbC of about 200 nm thickness were electron beam deposited on the sandblasted surface of metallic Ti substrates, preheated at 350 and 500 C, to improve the surface hardness of Ti implants intended for application in orthopaedics. According to both standard angular-dispersive X-ray diffraction measurements and rocking curve analysis performed by energy-dispersive X-ray diffraction, the films were found to be textured preferentially along the (200) crystallographic direction. The (200)-oriented crystallites are randomly rotated around their growth axes, with no correlation among adjacent domains. The measured intrinsic hardness of the films is 24-25 GPa for VC and 18-21 GPa for NbC. (literal)
- Prodotto di
- Autore CNR
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- Prodotto
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