Structure, morphology, and growth dynamics of perfluoro-pentacene thin films (Articolo in rivista)

Type
Label
  • Structure, morphology, and growth dynamics of perfluoro-pentacene thin films (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1002/pssr.200802052 (literal)
Alternative label
  • Kowarik S; Gerlach A; Hinderhofer A; Milita S; Borgatti F; Zontone F; Suzuki T; Biscarini F; Schreiber F (2008)
    Structure, morphology, and growth dynamics of perfluoro-pentacene thin films
    in Physica status solidi. Rapid research letters (Print); WILEY-V C H VERLAG GMBH, WEINHEIM (Germania)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Kowarik S; Gerlach A; Hinderhofer A; Milita S; Borgatti F; Zontone F; Suzuki T; Biscarini F; Schreiber F (literal)
Pagina inizio
  • 120 (literal)
Pagina fine
  • 122 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://onlinelibrary.wiley.com/doi/10.1002/pssr.200802052/abstract (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 2 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 3 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 3 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. Univ Tubingen, IAP, D-72076 Tubingen, Germany 2. CNR, IMM, I-40129 Bologna, Italy 3. CNR, ISMN, I-40129 Bologna, Italy 4. European Synchrotron Radiat Facil, F-38043 Grenoble, France 5. Inst Mol Sci, Okazaki, Aichi 4448787, Japan (literal)
Titolo
  • Structure, morphology, and growth dynamics of perfluoro-pentacene thin films (literal)
Abstract
  • We report high structural order in thin films of the organic semiconductor perfluoro-pentacene (PFP), which is a candidate material for n-type applications, deposited by vacuum sublimation on oxidized silicon wafers. Bragg reflections up to high order in both specular and grazing incidence geometries and a mosaicity of less than 0.01° demonstrate the well defined structure. The thin film entirely consists of crystallites with a structure close to the bulk phase without any contamination with a second phase. Real-time X-ray measurements show that PFP grows in a Stranski–Krastanov growth mode with the first monolayer wetting the substrate before 3d-growth sets in during growth of the second monolayer. Implications for its use are discussed. (literal)
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