http://www.cnr.it/ontology/cnr/individuo/prodotto/ID170334
Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography (Articolo in rivista)
- Type
- Label
- Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography (Articolo in rivista) (literal)
- Anno
- 2007-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1364/OE.15.014591 (literal)
- Alternative label
Ferraro P., Miccio L., Grilli S., Paturzo M., De Nicola S., Finizio A., Osellame R., Laporta P. (2007)
Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography
in Optics express; optical society of america, Washington (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Ferraro P., Miccio L., Grilli S., Paturzo M., De Nicola S., Finizio A., Osellame R., Laporta P. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-15-22-14591 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Istituto Nazionale di Ottica Applicata (INOA) del CNR, Via Campi Flegrei, 34 80072 Pozzuoli (Napoli) Italy
Istituto di Cibernetica del CNR \"E. Caianiello\" Via Campi Flegrei, 34 80072 Pozzuoli (Napoli) Italy
Istituto di Fotonica e Nanotecnologie del CNR - Dipartimento di Fisica del Politecnico di Milano P.zza L. da Vinci 32, 20133 Milano, Italy
Consiglio Nazionale delle Ricerche, Istituto di Cibernetica E. Caianiello, Comprensorio Olivetti, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy
Istituto Nazionale di Ottica Applicata, Sezione di Napoli, Comprensorio Olivetti, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy
Istituto di Fotonica e Nanotecnologie del CNR Dipartimento di Fisica del Politecnico di Milano P.zza L. da Vinci 32, 20133 Milano, Italy. (literal)
- Titolo
- Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography (literal)
- Abstract
- Quantitative Phase Microscopy (QPM) by interferometric
techniques can require a multiwavelength configuration to remove
2 pi ambiguity and improve accuracy. However, severe chromatic
aberration can affect the resulting phase-contrast map. By means of classical
interference microscope configuration it is quite unpractical to correct such
aberration. We propose and demonstrate that by Digital Holography (DH) in
a microscope configuration it is possible to clear out the QPM map from the
chromatic aberration in a simpler and more effective way with respect to
other approaches. The proposed method takes benefit of the unique feature
of DH to record in a plane out-of-focus and subsequently reconstruct
numerically at the right focal image plane. In fact, the main effect of the
chromatic aberration is to shift differently the correct focal image plane at
each wavelength and this can be readily compensated by adjusting the
corresponding reconstruction distance for each wavelength. A procedure is
described in order to determine easily the relative focal shift among
different imaging wavelengths by performing a scanning of the numerical
reconstruction along the optical axis, to find out the focus and to remove at the same time the chromatic aberration. (literal)
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