Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography (Articolo in rivista)

Type
Label
  • Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1364/OE.15.014591 (literal)
Alternative label
  • Ferraro P., Miccio L., Grilli S., Paturzo M., De Nicola S., Finizio A., Osellame R., Laporta P. (2007)
    Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography
    in Optics express; optical society of america, Washington (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Ferraro P., Miccio L., Grilli S., Paturzo M., De Nicola S., Finizio A., Osellame R., Laporta P. (literal)
Pagina inizio
  • 14591 (literal)
Pagina fine
  • 14600 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-15-22-14591 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 15 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 10 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 22 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto Nazionale di Ottica Applicata (INOA) del CNR, Via Campi Flegrei, 34 80072 Pozzuoli (Napoli) Italy Istituto di Cibernetica del CNR \"E. Caianiello\" Via Campi Flegrei, 34 80072 Pozzuoli (Napoli) Italy Istituto di Fotonica e Nanotecnologie del CNR - Dipartimento di Fisica del Politecnico di Milano P.zza L. da Vinci 32, 20133 Milano, Italy Consiglio Nazionale delle Ricerche, Istituto di Cibernetica ‘‘E. Caianiello’’, Comprensorio Olivetti, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy Istituto Nazionale di Ottica Applicata, Sezione di Napoli, Comprensorio Olivetti, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy Istituto di Fotonica e Nanotecnologie del CNR – Dipartimento di Fisica del Politecnico di Milano P.zza L. da Vinci 32, 20133 Milano, Italy. (literal)
Titolo
  • Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography (literal)
Abstract
  • Quantitative Phase Microscopy (QPM) by interferometric techniques can require a multiwavelength configuration to remove 2 pi ambiguity and improve accuracy. However, severe chromatic aberration can affect the resulting phase-contrast map. By means of classical interference microscope configuration it is quite unpractical to correct such aberration. We propose and demonstrate that by Digital Holography (DH) in a microscope configuration it is possible to clear out the QPM map from the chromatic aberration in a simpler and more effective way with respect to other approaches. The proposed method takes benefit of the unique feature of DH to record in a plane out-of-focus and subsequently reconstruct numerically at the right focal image plane. In fact, the main effect of the chromatic aberration is to shift differently the correct focal image plane at each wavelength and this can be readily compensated by adjusting the corresponding reconstruction distance for each wavelength. A procedure is described in order to determine easily the relative focal shift among different imaging wavelengths by performing a scanning of the numerical reconstruction along the optical axis, to find out the focus and to remove at the same time the chromatic aberration. (literal)
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