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Ferroelectric (Na1/2Bi1/2)TiO3-BaTiO3 thin films obtained by pulsed laser deposition (Articolo in rivista)
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- Label
- Ferroelectric (Na1/2Bi1/2)TiO3-BaTiO3 thin films obtained by pulsed laser deposition (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1051/jp4:2005128012 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M. Dinescu (1); F. Craciun (2); N. Scarisoreanu (1); P. Verardi (3); A. Moldovan (1); A. Purice (1); A. Sanson (4); C. Galassi (4) (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
- Conference: Meeting on Electro-Active Materials and Sustainable Growth Location: Abbey les Vaux de Cernay, FRANCE Date: MAY 23-25, 2005 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://jp4.journaldephysique.org/articles/jp4/abs/2005/06/jp4128012/jp4128012.html (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- (1) NILPRP Bucharest, PO Box MG-16, 77125, Romania
(2) CNR Istituto dei Sistemi Complessi, Via del Fosso del Cavaliere 100, 00133 Rome, Italy
(3) CNR-Istituto di Acustica, Via del Fosso del Cavaliere 100, 00133 Rome, Italy
(4) CNR-ISTEC, Via Granarolo 64, 48018 Faenza, Italy (literal)
- Titolo
- Ferroelectric (Na1/2Bi1/2)TiO3-BaTiO3 thin films obtained by pulsed laser deposition (literal)
- Abstract
- The solid solution of the ferroelectric relaxor (Na1/2Bi1/2)TiO3 with BaTiO3, (1-x) NBT-x BT (NBT-BT) shows a morphotropic phase boundary with enhanced properties at x = 0.06-0.07. We have prepared targets of (1-x) NBT-x BT with x = 0.06 by solid state reaction and sintering at 1200 æC, up to a final relative density of 97.8%. Films from these targets have been deposited on MgO substrates by pulsed laser deposition, in different substrate temperature and heating rate conditions. First results obtained from structural,AFMand electrical characterization are reported. The obtained films are polycrystalline perovskite with a slight (100) orientation. High relative dielectric constant, of about 1300, have been obtained. (literal)
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