Magnetic linear dichroism studies of in situ grown NiO thin films (Articolo in rivista)

Type
Label
  • Magnetic linear dichroism studies of in situ grown NiO thin films (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • Krishnakumar S.R., Liberati M., Grazioli C., Veronese M., Turchini S., Luches P., Valeri S., Carbone C. (2007)
    Magnetic linear dichroism studies of in situ grown NiO thin films
    in Journal of magnetism and magnetic materials
    (literal)
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  • Krishnakumar S.R., Liberati M., Grazioli C., Veronese M., Turchini S., Luches P., Valeri S., Carbone C. (literal)
Pagina inizio
  • 8 (literal)
Pagina fine
  • 12 (literal)
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  • 310 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Int Ctr Theoret Phys, I-34100 Trieste, Italy; Univ Modena, Dipartimento Fis, I-41100 Modena, Italy; INFM, Natl Ctr Nanostruct & Biosyst Surfaces S3, I-41100 Modena, Italy; CNR, Ist Struttura Mat, I-34012 Trieste, Italy (literal)
Titolo
  • Magnetic linear dichroism studies of in situ grown NiO thin films (literal)
Abstract
  • We report thickness dependence of magnetic linear dichroism (MLD) of in situ grown NiO(001) films on Ag(001) substrate at the Ni L-2 absorption edge. Antiferromagnetic domains at the surface of NiO(001) films are found to be preferentially aligned in-plane. For films thinner than a critical thickness t(c) (20-40ML), we observe a softening of the in-plane magnetic domain alignments with increasing film thickness, arising from the strain-relaxation effects. Films thicker than t(c) exhibits a residual in-plane anisotropy, possibly related to the finite-thickness effects. (c) 2006 Elsevier B.V. All rights reserved. (literal)
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