Dielectric spectroscopy measurement of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Dielectric spectroscopy measurement of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD (Articolo in rivista) (literal)

Anno

• 2004-01-01T00:00:00+01:00 (literal)

Alternative label

• Craciun F., Dinescu M., Verardi P., Scarisoreanu N., Galassi C., Piazza D. (2004)
  Dielectric spectroscopy measurement of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD
  in Ferroelectrics (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Craciun F., Dinescu M., Verardi P., Scarisoreanu N., Galassi C., Piazza D. (literal)

Pagina inizio

• 313 (literal)

Pagina fine

• 318 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 302 (literal)

Rivista

• Ferroelectrics (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note

• fasc. (1). Taylor & Francis. (literal)

Note

• ISI Web of Science (WOS) (literal)

Titolo

• Dielectric spectroscopy measurement of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD (literal)

Abstract

• Dielectric relaxation measurements on Pb1–x Lax(Zr0.65Ti0.35)1–x/4O3 with x = 0.09 (PLZT 9/65/35) thin films are presented. These films have been grown by pulsed laser deposition (PLD) assisted by radio frequency (RF) discharge in oxygen which allows to increase the plasma reactivity and to reduce the oxygen vacancies in films and at the film-bottom electrode interface. The small signal dielectric constant and loss have been measured in the frequency range 100 Hz–1 MHz while temperature was varied between 300 K and 570 K. Dielectric permittivity vs. temperature variation was typical of relaxor ferroelectrics, with a broad peak that shifted towards lower temperature for lower driving signal frequency. The temperature of the dielectric maximum was close to that obtained in bulk (about 340 K) but the permittivity value was much lower. This was attributed to two causes: (i) the presence of small quantities of pyrochlore phase; (ii) a low permittivity interface layer. The room temperature permittivity showed a linear decrease with the logarithm of driving field frequency, indicating a dominating contribution from domain-wall pinning processes below transition temperature. (literal)

Prodotto di

• Institute of Acoustics and Sensors \"Orso Mario Corbino\" (IDASC) (Istituto)
• Sensori e Tecniche Acustiche (SP.P02.005.001) (Modulo)
• Materiali Funzionali e Sistemi Disordinati (MD.P02.003.001) (Modulo)

Autore CNR

• FLORIANA RUSANESCU CRACIUN (Unità di personale interno)
• FRANCESCO CORDERO (Unità di personale interno)
• PATRIZIO VERARDI (Persona)

Insieme di parole chiave

• Keywords of "Dielectric spectroscopy measurement of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• FRANCESCO CORDERO (Unità di personale interno)
• FLORIANA RUSANESCU CRACIUN (Unità di personale interno)
• PATRIZIO VERARDI (Persona)

Prodotto

• Institute of Acoustics and Sensors \"Orso Mario Corbino\" (IDASC) (Istituto)
• Sensori e Tecniche Acustiche (SP.P02.005.001) (Modulo)
• Materiali Funzionali e Sistemi Disordinati (MD.P02.003.001) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Ferroelectrics (Rivista)

Insieme di parole chiave di

• Keywords of "Dielectric spectroscopy measurement of relaxor ferroelectric PLZT 9/65/35 thin films obtained by RF assisted PLD" (Insieme di parole chiave)