http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167270
Scanning electrooptic microscopy of the relaxor materials (Articolo in rivista)
- Type
- Label
- Scanning electrooptic microscopy of the relaxor materials (Articolo in rivista) (literal)
- Anno
- 2006-01-01T00:00:00+01:00 (literal)
- Alternative label
Tikhomirov, O; Labardi, M; Ascoli, C; Allegrini, M (2006)
Scanning electrooptic microscopy of the relaxor materials
in Ferroelectrics (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Tikhomirov, O; Labardi, M; Ascoli, C; Allegrini, M (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR, INFM, PolyLab, I-56127 Pisa, Italy; Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Moscow Region, Russia; Univ Pisa, Dipartimento Fis Enrico Fermi, I-56127 Pisa, Italy (literal)
- Titolo
- Scanning electrooptic microscopy of the relaxor materials (literal)
- Abstract
- Scanning electrooptic microscopy provides optical imaging of surface ferroelectric polarization patterns by measuring modulation of the output optical signal induced by a sinusoidal electric field. Ferroelectric single crystals and inhomogeneous phase transitions in ferroelectric thin films were investigated by this technique. Here we report investigation of the domain structure in relaxor materials. We have observed formation and evolution of microscopic domains under the action of a dc bias electric field. Furthermore, the local electrooptic switching loops have been measured with sub-micron resolution. Features of electrooptic imaging in ceramic samples are also discussed. (literal)
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