Electron spectroscopy study in the NbN growth for NbN/AlN interfaces (Articolo in rivista)

Type
Label
  • Electron spectroscopy study in the NbN growth for NbN/AlN interfaces (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • Lucci, M; Sanna, S; Contini, G; Zema, N; Merlo, V; Salvato, M; Thanh, HN; Davoli, I (2007)
    Electron spectroscopy study in the NbN growth for NbN/AlN interfaces
    in Surface science
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Lucci, M; Sanna, S; Contini, G; Zema, N; Merlo, V; Salvato, M; Thanh, HN; Davoli, I (literal)
Pagina inizio
  • 2647 (literal)
Pagina fine
  • 2650 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 601 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • ISM - CNR Università di Roma “Tor Vergata”, Roma, Italy Micro and Nano-structured Systems Laboratory (MINAS) Università di Roma, “Tor Vergata”, Italy CNR/INFM Laboratorio Regionale SuperMat, Baronissi (Sa), Italy Cryogenics Laboratory, Hanoi National University, Hanoi, Viet Nam (literal)
Titolo
  • Electron spectroscopy study in the NbN growth for NbN/AlN interfaces (literal)
Abstract
  • NbN superconductor and wide band gap AIN thin films were deposited using sputtering at room temperature. Study of the nitride interfaces are forerunner to the growth Josephson junctions that are considered able to work in the terahertz frequency. We find that to be compatible with lithography technology and to have a high critical transition temperature, the substrate should not be overheated, and this means working in low power regime to limit the induced heating of the plasma. X-ray photoelectron spectroscopy and X-ray diffraction analysis were performed on samples deposited on crystalline, amorphous, flexible, and nanostructured substrates. The experimental results suggest us how to improve the deposition process in order to obtain the best nitride films as well as NbN/A1N/NbN trilayers for Josephson junction applications. (C) 2006 Elsevier B.V. All rights reserved. (literal)
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Autore CNR di
Prodotto
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Insieme di parole chiave di
data.CNR.it