Pulsed laser deposition of PMN thin films (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Pulsed laser deposition of PMN thin films (Articolo in rivista) (literal)

Anno

• 2002-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/S1369-8001(02)00078-1 (literal)

Alternative label

• Craciun F., Verardi P., Brodoceanu D,Morar M., Galassi C.,Grigoriu C., Dinescu M. (2002)
  Pulsed laser deposition of PMN thin films
  in Materials science in semiconductor processing
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Craciun F., Verardi P., Brodoceanu D,Morar M., Galassi C.,Grigoriu C., Dinescu M. (literal)

Pagina inizio

• 227 (literal)

Pagina fine

• 232 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 5 (literal)

Rivista

• Materials science in semiconductor processing (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR-ISTEC etc (literal)

Titolo

• Pulsed laser deposition of PMN thin films (literal)

Abstract

• Lead magnesium niobate (Pb(Mg1/3Nb2/3)O3 or PMN) thin films have been deposited on different substrates by Pulsed Laser Deposition (PLD). Film composition was studied by Secondary Ion Mass Spectroscopy (SIMS) and their crystallinity by X-Ray Diffraction (XRD) techniques. Small-signal dielectric constant and loss factor of the films have been measured as a function of temperature and frequency on structures with 3 mm diameter - evaporated Au top electrodes, by using an impedance analyzer. The obtained PMN films have been found polycrystalline and partially oriented, with a certain amount of secondary pyrochlore phases and interface phases which are detrimental for the overall dielectric constant and modifies the relaxor behaviour of the heterostructures. Polarization hysteresis measurements performed at different temperatures below and above the dielectric maximum temperature Tm showed the persistence of polarization above Tm. (literal)

Prodotto di

• Institute of Acoustics and Sensors \"Orso Mario Corbino\" (IDASC) (Istituto)
• Institute of science and technology for ceramics (ISTEC) (Istituto)

Autore CNR

• FLORIANA RUSANESCU CRACIUN (Unità di personale interno)
• CARMEN GALASSI (Unità di personale interno)
• PATRIZIO VERARDI (Persona)

Incoming links:

Prodotto

• Institute of science and technology for ceramics (ISTEC) (Istituto)
• Institute of Acoustics and Sensors \"Orso Mario Corbino\" (IDASC) (Istituto)

Autore CNR di

• CARMEN GALASSI (Unità di personale interno)
• FLORIANA RUSANESCU CRACIUN (Unità di personale interno)
• PATRIZIO VERARDI (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Materials science in semiconductor processing (Rivista)