A new insight on crystalline strain and defect features by STEM–ADF imaging (Comunicazione a convegno)

Type
Label
  • A new insight on crystalline strain and defect features by STEM–ADF imaging (Comunicazione a convegno) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Alternative label
  • Grillo V. and F. Rossi (2010)
    A new insight on crystalline strain and defect features by STEM–ADF imaging
    in The 16th International Conference on Crystal Growth(ICCG-16), Beijing, China
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Grillo V. and F. Rossi (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • Beijing - China8-13 August 2010 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR NANO - S3 Modena (literal)
Titolo
  • A new insight on crystalline strain and defect features by STEM–ADF imaging (literal)
Prodotto di
Autore CNR

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Prodotto
data.CNR.it