http://www.cnr.it/ontology/cnr/individuo/prodotto/ID132001
Detecting light atoms at sub-angstrom resolution by TEM electron diffractive imaging (Comunicazione a convegno)
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- Detecting light atoms at sub-angstrom resolution by TEM electron diffractive imaging (Comunicazione a convegno) (literal)
- Anno
- 2010-01-01T00:00:00+01:00 (literal)
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E. Carlino1*, L. De Caro2, C. Giannini2, P. D. Cozzoli3, G. Caputo3 (2010)
Detecting light atoms at sub-angstrom resolution by TEM electron diffractive imaging
in world conference of IFSM on electron microscopy IMC 17, RIO DE JANEIRO, 19-24 September 2010
(literal)
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- E. Carlino1*, L. De Caro2, C. Giannini2, P. D. Cozzoli3, G. Caputo3 (literal)
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- 1 IOM-CNR laboratorio TASC, Area Science Park - Basovizza, Bld. MM SS 14, Km 163.5 - 34149
Trieste - Italy - carlino@tasc.infm.it
2 Istituto di Cristallografia (IC-CNR) via Amendola 122/O, 70126 Bari, Italy
3 National Nanotechnology Laboratory (NNL) of CNR-INFM, Unità di Ricerca IIT and Scuola
Superiore ISUFI, Università del Salento, Distretto Tecnologico, Via per Arnesano Km 5, 73100
Lecce, Italy (literal)
- Titolo
- Detecting light atoms at sub-angstrom resolution by TEM electron diffractive imaging (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#curatoriVolume
- G. Solorzano, W. de Souza (literal)
- Abstract
- Herein, we demonstrate an EDI methodology, performed in a Jeol 2010F UHR microscope (spherical aberration coefficient Cs = 0.47±0.01 mm), by which the crystal structure of transition-metal oxide nanocrystals can be determined at 70 pm of resolution while unambiguously revealing the presence and location of light elements atomic columns in the relevant lattice. This approach, applied as a case study to TiO2 in the form of organic-capped nano-rods, also allows appreciating subtle alterations in the unit cell structure of the nano-crystals, relative to that inherent to the bulk material counterpart, which would not be otherwise detectable by conventional HRTEM. Such structural deviations could be at the origin of peculiar size-dependent physical-chemical properties of the concerned oxide material in the nanoscale regime. In addition, it is worthwhile to remark that this result has been achieved exposing the specimen to an electron dose as low as 106 e/nm2. The latter condition usually prevents the specimen against possible structural damages under exposure to 200 keV electrons, the induction of which remains one of the key issues in the ultimate accuracy achievable in the structural determination of materials [4]. (literal)
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