Structural examination of all along the thickness of polymeric thin films by sinchrotron radiation. (Abstract/Poster in atti di convegno)

Type
Label
  • Structural examination of all along the thickness of polymeric thin films by sinchrotron radiation. (Abstract/Poster in atti di convegno) (literal)
Anno
  • 2009-01-01T00:00:00+01:00 (literal)
Alternative label
  • Porzio W., Scavia G., Barba L., Arrighetti G., Milita S. (2009)
    Structural examination of all along the thickness of polymeric thin films by sinchrotron radiation.
    in Symposium R : X-ray techniques for advanced materials, nanostructures and thin films: from laboratory sources to synchrotron radiation, Strasburgo
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Porzio W., Scavia G., Barba L., Arrighetti G., Milita S. (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Milita CNR-IMM Bologna, Porzio, Scavia CNR-Ismac Milano (literal)
Titolo
  • Structural examination of all along the thickness of polymeric thin films by sinchrotron radiation. (literal)
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