http://www.cnr.it/ontology/cnr/individuo/prodotto/ID115588
Electrical properties of Al203/4H-SiC structures grown by atomic layer chemicl vapor deposition (Abstract/Poster in atti di convegno)
- Type
- Label
- Electrical properties of Al203/4H-SiC structures grown by atomic layer chemicl vapor deposition (Abstract/Poster in atti di convegno) (literal)
- Anno
- 2006-01-01T00:00:00+01:00 (literal)
- Alternative label
Avice M, Grossner U, Pintilie I, Svensson BG, Servidori M, Nipoti R, Nilsen O, Fjellvag H, (2006)
Electrical properties of Al203/4H-SiC structures grown by atomic layer chemicl vapor deposition
in ECSCRM 2006, Newcastle upon Tyne, UK
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Avice M, Grossner U, Pintilie I, Svensson BG, Servidori M, Nipoti R, Nilsen O, Fjellvag H, (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#descrizioneSinteticaDelProdotto
- Al2O3 films have been deposited on n-type and p-type 4H-SiC by atomic layer chemical vapor deposition using trimethylaluminum as a precursor for aluminum and both H2O and O-3 as an oxidant. After oxide deposition, annealing at different temperatures (800, 900, 1000 degrees C) in argon atmosphere for different durations (1, 2, 3 h) was performed. Bulk and interface properties of the oxide films were studied by capacitance-voltage, current-voltage, deep level transient spectroscopy, and thermally dielectric relaxation current (TDRC) measurements. The results reveal a decreasing flatband voltage with increasing annealing time, suggesting decrease of oxide charges and deep interface traps. After 3 h annealing at 1000 degrees C of the n-type samples, the flatband voltage is reduced to 6 V compared to a value in excess of 40 V for as-deposited samples. The TDRC measurements on annealed Al2O3/SiC (n-type) capacitors showed substantially different spectra relative to conventional SiO2/4H-SiC control samples; in the former ones no signal was recorded at temperatures less than 100 K, demonstrating a low density of shallow electron traps below the conduction band edge of 4H-SiC and hence a prospect of obtaining a high electron channel mobility in 4H-SiC metal-oxide-semiconductor field-effect devices with Al2O3 as gate dielectric. (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Univ Oslo, Dept Phys, N-0316 Oslo, Norway;
Univ Oslo, SMN, N-0316 Oslo, Norway;
Sez Bologna, CNR-IMM, I-40129 Bologna, Italy;
(literal)
- Titolo
- Electrical properties of Al203/4H-SiC structures grown by atomic layer chemicl vapor deposition (literal)
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- Autore CNR
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