Porosity of mesoporous silica thin films: kinetics of teh template removal process by ellipsometry (Abstract/Poster in atti di convegno)

Type
Label
  • Porosity of mesoporous silica thin films: kinetics of teh template removal process by ellipsometry (Abstract/Poster in atti di convegno) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Alternative label
  • M. Losurdo, M.M. Giangregorio, G. Bruno, F. Poli, L. Armelao, E. Tondello, (2006)
    Porosity of mesoporous silica thin films: kinetics of teh template removal process by ellipsometry
    in E-MRS, Nice, France
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • M. Losurdo, M.M. Giangregorio, G. Bruno, F. Poli, L. Armelao, E. Tondello, (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 8) M. Losurdo, M.M. Giangregorio, G. Bruno, F. Poli, L. Armelao, E. Tondello, “Porosity of mesoporous silica thin films: kinetics of teh template removal process by ellipsometry”, E-MRS, May 29-June 2, 2006 Nice, France 8) M. Losurdo, M.M. Giangregorio, G. Bruno, F. Poli, L. Armelao, E. Tondello, “Porosity of mesoporous silica thin films: kinetics of teh template removal process by ellipsometry”, E-MRS, May 29-June 2, 2006 Nice, France (literal)
Titolo
  • Porosity of mesoporous silica thin films: kinetics of teh template removal process by ellipsometry (literal)
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