Conductive atomic force microscopy
- Label
- Conductive atomic force microscopy (literal)
- Membro di
- Keywords of "Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy" (Insieme di parole chiave)
- Parole chiave di "Origin of the current transport anisotropy in epitaxial graphene grown on vicinal 4H-SiC (0001) surfaces" (Insieme di parole chiave)
- Parole chiave di "Transport localization in heterogeneous Schottky barriers of quantum-defined metal films" (Insieme di parole chiave)
- Parole chiave di "Lateral uniformity of the transport properties of graphene/4H-SiC (0001) interface by nanoscale current measurements" (Insieme di parole chiave)
- Keywords of "Electrical activity of structural defects in 3C-SiC" (Insieme di parole chiave)
- Value
- Conductive atomic force microscopy (literal)
Incoming links:
- Ha membro
- Keywords of "Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy" (Insieme di parole chiave)
- Parole chiave di "Lateral uniformity of the transport properties of graphene/4H-SiC (0001) interface by nanoscale current measurements" (Insieme di parole chiave)
- Parole chiave di "Origin of the current transport anisotropy in epitaxial graphene grown on vicinal 4H-SiC (0001) surfaces" (Insieme di parole chiave)
- Keywords of "Electrical activity of structural defects in 3C-SiC" (Insieme di parole chiave)
- Parole chiave di "Transport localization in heterogeneous Schottky barriers of quantum-defined metal films" (Insieme di parole chiave)
