thickness
- Label
- thickness (literal)
- Membro di
- Keywords of "Method for measuring the refractive index and the thickness of transparent plates by a lateral-shear, wavelength scanning interferometer" (Insieme di parole chiave)
- Keywords of "Evolution of nanostructures of anatase TiO2 thin films grown on (001) LaAlO3" (Insieme di parole chiave)
- Parole chiave di "Simple interferometric method for measuring the refractive index and the thickness of transparent plates" (Insieme di parole chiave)
- Parole chiave di "Monitoring the thinning dynamics of soap films by phase shift interferometry. The case of perfluoropolyether surfactants" (Insieme di parole chiave)
- Parole chiave di "Synthesis of uniform disk-shaped copper telluride nanocrystals and cation exchange to cadmium telluride quantum disks with stable red emission" (Insieme di parole chiave)
- Parole chiave di "Thickness measurement of thin transparent plates with a broadband wavelength-scanning interferometer" (Insieme di parole chiave)
- Value
- thickness (literal)
Incoming links:
- Ha membro
- Keywords of "Method for measuring the refractive index and the thickness of transparent plates by a lateral-shear, wavelength scanning interferometer" (Insieme di parole chiave)
- Parole chiave di "Synthesis of uniform disk-shaped copper telluride nanocrystals and cation exchange to cadmium telluride quantum disks with stable red emission" (Insieme di parole chiave)
- Parole chiave di "Monitoring the thinning dynamics of soap films by phase shift interferometry. The case of perfluoropolyether surfactants" (Insieme di parole chiave)
- Parole chiave di "Simple interferometric method for measuring the refractive index and the thickness of transparent plates" (Insieme di parole chiave)
- Parole chiave di "Thickness measurement of thin transparent plates with a broadband wavelength-scanning interferometer" (Insieme di parole chiave)
- Keywords of "Evolution of nanostructures of anatase TiO2 thin films grown on (001) LaAlO3" (Insieme di parole chiave)
