dielectric
- Label
- dielectric (literal)
- Membro di
- Parole chiave di "Dielectric thickness dependence of capacitive behavior in graphene deposited on silicon dioxide" (Insieme di parole chiave)
- Parole chiave di "Influence of substrate temperature on the chemical and microstructural properties of MO-CVD ZrTiO4 thin films" (Insieme di parole chiave)
- Keywords of "Effects of deposition temperature on the microstructural and electrical properties of praseodymium oxide-based films" (Insieme di parole chiave)
- Keywords of "Effects of high temperature annealing on MOCVD grown CaCu3Ti4O12 films on LaAlO3 substrates" (Insieme di parole chiave)
- Keywords of "Thermal and plasma-enhanced atomic layer deposition of hafnium oxide on semiconductor substrates" (Insieme di parole chiave)
- Parole chiave di "Effects of the thermal annealing processes on praseodymium oxide based films grown on silicon substrates" (Insieme di parole chiave)
- Value
- dielectric (literal)
Incoming links:
- Ha membro
- Keywords of "Effects of high temperature annealing on MOCVD grown CaCu3Ti4O12 films on LaAlO3 substrates" (Insieme di parole chiave)
- Parole chiave di "Effects of the thermal annealing processes on praseodymium oxide based films grown on silicon substrates" (Insieme di parole chiave)
- Parole chiave di "Dielectric thickness dependence of capacitive behavior in graphene deposited on silicon dioxide" (Insieme di parole chiave)
- Parole chiave di "Influence of substrate temperature on the chemical and microstructural properties of MO-CVD ZrTiO4 thin films" (Insieme di parole chiave)
- Keywords of "Thermal and plasma-enhanced atomic layer deposition of hafnium oxide on semiconductor substrates" (Insieme di parole chiave)
- Keywords of "Effects of deposition temperature on the microstructural and electrical properties of praseodymium oxide-based films" (Insieme di parole chiave)