Electron diffraction
- Label
- Electron diffraction (literal)
- Membro di
- Parole chiave di "Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles" (Insieme di parole chiave)
- Parole chiave di "Improved TEM sample preparation by low energy FIB for strain analysis by convergent beam electron diffraction" (Insieme di parole chiave)
- Parole chiave di "Four slits interference and diffraction experiments" (Insieme di parole chiave)
- Parole chiave di "Convergent beam electron diffraction investigation of strain induced by Ti self-aligned silicides in shallow trench Si isolation structures" (Insieme di parole chiave)
- Parole chiave di "Structural and analytical characterization by scanning transmission electron microscopy of silicon-based nanostructures" (Insieme di parole chiave)
- Keywords of "Improving spatial resolution of convergent beam electron diffraction strain mapping in silicon microstructures" (Insieme di parole chiave)
- Keywords of "Structure and growth mode of thin Co films on Fe(001): comparison of purely thermal and ion-assisted deposition" (Insieme di parole chiave)
- Value
- Electron diffraction (literal)
Incoming links:
- Ha membro
- Parole chiave di "Structural and analytical characterization by scanning transmission electron microscopy of silicon-based nanostructures" (Insieme di parole chiave)
- Keywords of "Structure and growth mode of thin Co films on Fe(001): comparison of purely thermal and ion-assisted deposition" (Insieme di parole chiave)
- Keywords of "Improving spatial resolution of convergent beam electron diffraction strain mapping in silicon microstructures" (Insieme di parole chiave)
- Parole chiave di "Four slits interference and diffraction experiments" (Insieme di parole chiave)
- Parole chiave di "Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles" (Insieme di parole chiave)
- Parole chiave di "Improved TEM sample preparation by low energy FIB for strain analysis by convergent beam electron diffraction" (Insieme di parole chiave)
- Parole chiave di "Convergent beam electron diffraction investigation of strain induced by Ti self-aligned silicides in shallow trench Si isolation structures" (Insieme di parole chiave)
