http://www.cnr.it/ontology/cnr/individuo/parolaChiave/1189

ADVANCED GATE DIELECTRICS

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ADVANCED GATE DIELECTRICS (literal)

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Keywords of "Degradation kinetics of ultrathin HfO2 layers on Si(100) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM" (Insieme di parole chiave)

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ADVANCED GATE DIELECTRICS (literal)

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Ha membro

Keywords of "Degradation kinetics of ultrathin HfO2 layers on Si(100) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM" (Insieme di parole chiave)

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