http://www.cnr.it/ontology/cnr/individuo/parolaChiave/112885

EXTENDED DEFECTS

Label

EXTENDED DEFECTS (literal)

Membro di

Parole chiave di "Strengths and limitations of the vacancy engineering approach for the control of dopant diffusion and activation in silicon" (Insieme di parole chiave)
Parole chiave di "H induced optically-active defects in silicon photonic nanocavities" (Insieme di parole chiave)

Value

EXTENDED DEFECTS (literal)

Incoming links:

Ha membro

Parole chiave di "H induced optically-active defects in silicon photonic nanocavities" (Insieme di parole chiave)
Parole chiave di "Strengths and limitations of the vacancy engineering approach for the control of dopant diffusion and activation in silicon" (Insieme di parole chiave)

data.CNR.it