CHANNEL MOBILITY
- Label
- CHANNEL MOBILITY (literal)
- Membro di
- Parole chiave di "Correlating macroscopic and nanoscale electrical modifications of SiO2/4H-SiC interfaces upon post-oxidation-annealing in N2O and POCl3" (Insieme di parole chiave)
- Parole chiave di "Passivation by N Implantation of the SiO2/SiC Acceptor Interface States: Impact on the Oxide Hole Traps and the Gate Oxide Reliability" (Insieme di parole chiave)
- Value
- CHANNEL MOBILITY (literal)
Incoming links:
- Ha membro
- Parole chiave di "Correlating macroscopic and nanoscale electrical modifications of SiO2/4H-SiC interfaces upon post-oxidation-annealing in N2O and POCl3" (Insieme di parole chiave)
- Parole chiave di "Passivation by N Implantation of the SiO2/SiC Acceptor Interface States: Impact on the Oxide Hole Traps and the Gate Oxide Reliability" (Insieme di parole chiave)