Defects

Label

• Defects (literal)

Membro di

• Keywords of "Defects in nanostructures with ripened InAs/GaAs quantum dots" (Insieme di parole chiave)
• Parole chiave di "4H-SiC epitaxial layer growth by trichlorosilane (TCS)" (Insieme di parole chiave)
• Keywords of "Ab-initio calculation of formation and migration energies of intrinsic defects in BaF2" (Insieme di parole chiave)
• Keywords of "n(+)/p diodes realized in SiC by phosphorus ion implantation: Electrical characterization as a function of temperature" (Insieme di parole chiave)
• Keywords of "Incorporation of active Fe impurities in GaInP by high temperature ion implantation" (Insieme di parole chiave)
• Parole chiave di "Sputtered Ge-on-Si heteroepitaxial pn junctions: Nanostructure, interface morphology and photoelectrical properties" (Insieme di parole chiave)
• Parole chiave di "Probing point defects inBa(B1/3B''2/3)O3 by ESR, PAS and dielectric spectroscopy" (Insieme di parole chiave)
• Keywords of "Origin of TSL peaks located at 200-250 K in UV-irradiated PbWO4 crystals" (Insieme di parole chiave)
• Keywords of "Current-induced defect formation in multi-walled carbon nanotubes" (Insieme di parole chiave)
• Keywords of "The \"nonstioichiometrics-structure-property\" triad for wuestite" (Insieme di parole chiave)
• Keywords of "Mapping local defects in PbO-based piezoceramics" (Insieme di parole chiave)
• Parole chiave di "Curvature control of valence on nematic shells" (Insieme di parole chiave)
• Keywords of "Optimisation of Epitaxial Layer Growth with HCl Addition by Optical and Electrical Characterization" (Insieme di parole chiave)
• Parole chiave di "Incorporation of active Fe impurities in GaInP by High Temperature Ion implantation" (Insieme di parole chiave)

Value

• Defects (literal)

Incoming links:

Ha membro

• Keywords of "Origin of TSL peaks located at 200-250 K in UV-irradiated PbWO4 crystals" (Insieme di parole chiave)
• Keywords of "Ab-initio calculation of formation and migration energies of intrinsic defects in BaF2" (Insieme di parole chiave)
• Keywords of "Current-induced defect formation in multi-walled carbon nanotubes" (Insieme di parole chiave)
• Keywords of "The \"nonstioichiometrics-structure-property\" triad for wuestite" (Insieme di parole chiave)
• Keywords of "Mapping local defects in PbO-based piezoceramics" (Insieme di parole chiave)
• Parole chiave di "Curvature control of valence on nematic shells" (Insieme di parole chiave)
• Keywords of "Optimisation of Epitaxial Layer Growth with HCl Addition by Optical and Electrical Characterization" (Insieme di parole chiave)
• Keywords of "Incorporation of active Fe impurities in GaInP by high temperature ion implantation" (Insieme di parole chiave)
• Keywords of "n(+)/p diodes realized in SiC by phosphorus ion implantation: Electrical characterization as a function of temperature" (Insieme di parole chiave)
• Parole chiave di "Incorporation of active Fe impurities in GaInP by High Temperature Ion implantation" (Insieme di parole chiave)
• Parole chiave di "Sputtered Ge-on-Si heteroepitaxial pn junctions: Nanostructure, interface morphology and photoelectrical properties" (Insieme di parole chiave)
• Keywords of "Defects in nanostructures with ripened InAs/GaAs quantum dots" (Insieme di parole chiave)
• Parole chiave di "Probing point defects inBa(B1/3B''2/3)O3 by ESR, PAS and dielectric spectroscopy" (Insieme di parole chiave)
• Parole chiave di "4H-SiC epitaxial layer growth by trichlorosilane (TCS)" (Insieme di parole chiave)