Keywords of "Analysis of extended defects in CZ silicon annealed in either oxygen or nitrogen by optical and electron beams methods"

Label

• Keywords of "Analysis of extended defects in CZ silicon annealed in either oxygen or nitrogen by optical and electron beams methods" (literal)
• Parole chiave di "Analysis of extended defects in CZ silicon annealed in either oxygen or nitrogen by optical and electron beams methods" (literal)

Insieme di parole chiave di

• Analysis of extended defects in CZ silicon annealed in either oxygen or nitrogen by optical and electron beams methods (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Ha membro

• Oxygen precipitates (Parola chiave)
• Stacking faults (Parola chiave)
• Vacancies (Parola chiave)
• TEM (Parola chiave)
• LST (Parola chiave)

Incoming links:

Insieme di parole chiave

• Analysis of extended defects in CZ silicon annealed in either oxygen or nitrogen by optical and electron beams methods (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Membro di

• TEM (Parola chiave)
• Vacancies (Parola chiave)
• Stacking faults (Parola chiave)
• LST (Parola chiave)
• Oxygen precipitates (Parola chiave)