Keywords of "Simulation Study of the Trapping Properties of HfO2-Based Charge-Trap Memory Cells"
- Label
- Keywords of "Simulation Study of the Trapping Properties of HfO2-Based Charge-Trap Memory Cells" (literal)
- Parole chiave di "Simulation Study of the Trapping Properties of HfO2-Based Charge-Trap Memory Cells" (literal)
- Insieme di parole chiave di
- Ha membro
- Charge-trap (CT) memories (Parola chiave)
- trapping properties (Parola chiave)
- hafnium oxide (Parola chiave)
- material analysis (Parola chiave)
- modeling (Parola chiave)
Incoming links:
- Insieme di parole chiave
- Membro di
- modeling (Parola chiave)
- material analysis (Parola chiave)
- trapping properties (Parola chiave)
- hafnium oxide (Parola chiave)
- Charge-trap (CT) memories (Parola chiave)
