Keywords of "Electrical activity of structural defects in 3C-SiC"
- Label
- Keywords of "Electrical activity of structural defects in 3C-SiC" (literal)
- Parole chiave di "Electrical activity of structural defects in 3C-SiC" (literal)
- Insieme di parole chiave di
- Electrical activity of structural defects in 3C-SiC (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Ha membro
- Conductive atomic force microscopy (Parola chiave)
- Conductive AFM (Parola chiave)
- Epilayers (Parola chiave)
- Semiconducting silicon compounds (Parola chiave)
- SiC diodes (Parola chiave)
- Cubic silicon carbide (3C-SiC) (Parola chiave)
- Atomic force microscopy (Parola chiave)
- Epitaxial growth (Parola chiave)
- Current-voltage characterization (Parola chiave)
- Contact properties (Parola chiave)
- Structural defect (Parola chiave)
- Ultraviolet irradiations (Parola chiave)
- Electrical characterization (Parola chiave)
- Stacking faults (Parola chiave)
- Electric properties (Parola chiave)
- Different substrates (Parola chiave)
- Schottky contacts (Parola chiave)
- Leakage currents (Parola chiave)
- Passivation (Parola chiave)
- 3C-SiC (Parola chiave)
- Electrical activities (Parola chiave)
- Surface defects (Parola chiave)
- Schottky behaviors (Parola chiave)
- Silicon carbide (Parola chiave)
- Semi-conductor surfaces (Parola chiave)
Incoming links:
- Insieme di parole chiave
- Electrical activity of structural defects in 3C-SiC (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Membro di
- Different substrates (Parola chiave)
- Atomic force microscopy (Parola chiave)
- Schottky contacts (Parola chiave)
- Conductive atomic force microscopy (Parola chiave)
- Silicon carbide (Parola chiave)
- Electrical characterization (Parola chiave)
- Electric properties (Parola chiave)
- 3C-SiC (Parola chiave)
- Stacking faults (Parola chiave)
- Epitaxial growth (Parola chiave)
- Semiconducting silicon compounds (Parola chiave)
- Leakage currents (Parola chiave)
- Epilayers (Parola chiave)
- Passivation (Parola chiave)
- Conductive AFM (Parola chiave)
- SiC diodes (Parola chiave)
- Cubic silicon carbide (3C-SiC) (Parola chiave)
- Electrical activities (Parola chiave)
- Surface defects (Parola chiave)
- Schottky behaviors (Parola chiave)
- Semi-conductor surfaces (Parola chiave)
- Current-voltage characterization (Parola chiave)
- Contact properties (Parola chiave)
- Structural defect (Parola chiave)
- Ultraviolet irradiations (Parola chiave)