Keywords of "Photoelectron spectroscopy study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack"

Label

• Keywords of "Photoelectron spectroscopy study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack" (literal)
• Parole chiave di "Photoelectron spectroscopy study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack" (literal)

Insieme di parole chiave di

• Photoelectron spectroscopy study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Ha membro

• INTERFACE (Parola chiave)
• SI (Parola chiave)
• SURFACES (Parola chiave)
• BAND (Parola chiave)
• CORE-LEVEL SHIFTS (Parola chiave)

Incoming links:

Insieme di parole chiave

• Photoelectron spectroscopy study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Membro di

• SURFACES (Parola chiave)
• INTERFACE (Parola chiave)
• SI (Parola chiave)
• BAND (Parola chiave)
• CORE-LEVEL SHIFTS (Parola chiave)