Keywords of "Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons"

Label

• Keywords of "Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons" (literal)
• Parole chiave di "Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons" (literal)

Insieme di parole chiave di

• Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Ha membro

• Electron-solid diffraction (Parola chiave)
• Cobalt disilicide (Parola chiave)
• Surface structure (Parola chiave)
• AES (Parola chiave)

Incoming links:

Insieme di parole chiave

• Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Membro di

• Surface structure (Parola chiave)
• AES (Parola chiave)
• Cobalt disilicide (Parola chiave)
• Electron-solid diffraction (Parola chiave)