Parole chiave di "Small-area XPS depth profiling and AFM investigation on plasma-enhanced CVD SiNx films grown on GaAs (100) surfaces"

Label

• Parole chiave di "Small-area XPS depth profiling and AFM investigation on plasma-enhanced CVD SiNx films grown on GaAs (100) surfaces" (literal)
• Keywords of "Small-area XPS depth profiling and AFM investigation on plasma-enhanced CVD SiNx films grown on GaAs (100) surfaces" (literal)

Insieme di parole chiave di

• Small-area XPS depth profiling and AFM investigation on plasma-enhanced CVD SiNx films grown on GaAs (100) surfaces (Contributo in atti di convegno) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1301)

Ha membro

• SEMICONDUCTOR (Parola chiave)
• X-RAY PHOTOELECTRON SPECTROSCOPY (Parola chiave)
• GROWTH MODEL (Parola chiave)
• GaAs (Parola chiave)
• SILICON NITRIDE (Parola chiave)

Incoming links:

Insieme di parole chiave

• Small-area XPS depth profiling and AFM investigation on plasma-enhanced CVD SiNx films grown on GaAs (100) surfaces (Contributo in atti di convegno) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1301)

Membro di

• SEMICONDUCTOR (Parola chiave)
• GaAs (Parola chiave)
• X-RAY PHOTOELECTRON SPECTROSCOPY (Parola chiave)
• SILICON NITRIDE (Parola chiave)
• GROWTH MODEL (Parola chiave)