Parole chiave di "Characterization of Pt/AlN/Pt-based structures for high temperature, microwave electroacoustic devices applications"

Label

• Parole chiave di "Characterization of Pt/AlN/Pt-based structures for high temperature, microwave electroacoustic devices applications" (literal)
• Keywords of "Characterization of Pt/AlN/Pt-based structures for high temperature, microwave electroacoustic devices applications" (literal)

Insieme di parole chiave di

• Characterization of Pt/AlN/Pt-based structures for high temperature, microwave electroacoustic devices applications (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• X ray diffraction (Parola chiave)
• Platinum (Parola chiave)
• Thin films (Parola chiave)
• AlN (Parola chiave)
• Piezoelectricity (Parola chiave)

Incoming links:

Insieme di parole chiave

• Characterization of Pt/AlN/Pt-based structures for high temperature, microwave electroacoustic devices applications (Articolo in rivista) (Prodotto della ricerca)

Membro di

• Thin films (Parola chiave)
• X ray diffraction (Parola chiave)
• Platinum (Parola chiave)
• Piezoelectricity (Parola chiave)
• AlN (Parola chiave)