Keywords of "An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer"

Label

• Keywords of "An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer" (literal)
• Parole chiave di "An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer" (literal)

Insieme di parole chiave di

• An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• XPS (Parola chiave)
• AFM (Parola chiave)
• SELF ASSEMBLED MONOLAYER (Parola chiave)
• COUPLING LAYER (Parola chiave)

Incoming links:

Insieme di parole chiave

• An x-ray photoelectron spectra and atomic force microscopy characterization of silica substrates engineered with a covalently assembled siloxane monolayer (Articolo in rivista) (Prodotto della ricerca)

Membro di

• XPS (Parola chiave)
• AFM (Parola chiave)
• SELF ASSEMBLED MONOLAYER (Parola chiave)
• COUPLING LAYER (Parola chiave)