Parole chiave di "Grain boundary evaluation in sequentially laterally solidified polycrystalline-silicon devices"

Label

• Parole chiave di "Grain boundary evaluation in sequentially laterally solidified polycrystalline-silicon devices" (literal)
• Keywords of "Grain boundary evaluation in sequentially laterally solidified polycrystalline-silicon devices" (literal)

Insieme di parole chiave di

• Grain boundary evaluation in sequentially laterally solidified polycrystalline-silicon devices (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• hole traps (Parola chiave)
• electron traps (Parola chiave)
• solidification (Parola chiave)
• grain boundaries (Parola chiave)
• thin film transistors (Parola chiave)

Incoming links:

Insieme di parole chiave

• Grain boundary evaluation in sequentially laterally solidified polycrystalline-silicon devices (Articolo in rivista) (Prodotto della ricerca)

Membro di

• thin film transistors (Parola chiave)
• hole traps (Parola chiave)
• electron traps (Parola chiave)
• solidification (Parola chiave)
• grain boundaries (Parola chiave)