Parole chiave di "Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles"

Label

• Parole chiave di "Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles" (literal)
• Keywords of "Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles" (literal)

Insieme di parole chiave di

• Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• Electron diffraction (Parola chiave)
• Displacement fields (Parola chiave)
• Strain (Parola chiave)
• Nanostructures (Parola chiave)
• Silicon (Parola chiave)

Incoming links:

Insieme di parole chiave

• Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles (Articolo in rivista) (Prodotto della ricerca)

Membro di

• Displacement fields (Parola chiave)
• Nanostructures (Parola chiave)
• Silicon (Parola chiave)
• Electron diffraction (Parola chiave)
• Strain (Parola chiave)