Keywords of "Detailed DF-TEM and X-ray diffraction investigations of interfaces in MOVPE grown InGaP/GaAs heterojunctions"

Label

• Keywords of "Detailed DF-TEM and X-ray diffraction investigations of interfaces in MOVPE grown InGaP/GaAs heterojunctions" (literal)
• Parole chiave di "Detailed DF-TEM and X-ray diffraction investigations of interfaces in MOVPE grown InGaP/GaAs heterojunctions" (literal)

Insieme di parole chiave di

• Detailed DF-TEM and X-ray diffraction investigations of interfaces in MOVPE grown InGaP/GaAs heterojunctions (Abstract/Poster in atti di convegno) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1302)

Ha membro

• InGaP/GaAs (Parola chiave)
• Interface (Parola chiave)
• Chemical composition (Parola chiave)
• Electron beam methods (Parola chiave)

Incoming links:

Insieme di parole chiave

• Detailed DF-TEM and X-ray diffraction investigations of interfaces in MOVPE grown InGaP/GaAs heterojunctions (Abstract/Poster in atti di convegno) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1302)

Membro di

• Chemical composition (Parola chiave)
• InGaP/GaAs (Parola chiave)
• Interface (Parola chiave)
• Electron beam methods (Parola chiave)