American Vacuum Society, American Institute Of Physics

Label

• American Vacuum Society, American Institute Of Physics (literal)
• American Vacuum Society, American Institute Of Physics (literal)

Editore di

• Silicon resonant microcantilevers for absolute pressure measurement (Articolo in rivista) (Prodotto della ricerca)
• X-RAY-INDUCED REDUCTION EFFECTS AT CEO2 SURFACES - AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY (Articolo in rivista) (Prodotto della ricerca)
• Investigation of a nanocrystalline silicon phase embedded in SiOx thin films grown by pulsed laser deposition (Articolo in rivista) (Prodotto della ricerca)
• Influence of the deposition parameters on the electronic and structural properties of pulsed laser ablation prepared Si1-xCx thin films (Articolo in rivista) (Prodotto della ricerca)
• Room temperature migration of boron in crystalline silicon during secondary ion mass spectrometry profiling (Articolo in rivista) (Prodotto della ricerca)
• Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
• Experimental aspects and modeling for quantitative measurements in scanning capacitance microscopy (Articolo in rivista) (Prodotto della ricerca)

Preferred label

• American Vacuum Society, American Institute Of Physics, Melville (USA) (literal)
• American Vacuum Society, American Institute Of Physics, Melville (USA) (literal)

Incoming links:

Editore

• Room temperature migration of boron in crystalline silicon during secondary ion mass spectrometry profiling (Articolo in rivista) (Prodotto della ricerca)
• Experimental aspects and modeling for quantitative measurements in scanning capacitance microscopy (Articolo in rivista) (Prodotto della ricerca)
• Investigation of a nanocrystalline silicon phase embedded in SiOx thin films grown by pulsed laser deposition (Articolo in rivista) (Prodotto della ricerca)
• Influence of the deposition parameters on the electronic and structural properties of pulsed laser ablation prepared Si1-xCx thin films (Articolo in rivista) (Prodotto della ricerca)
• Silicon resonant microcantilevers for absolute pressure measurement (Articolo in rivista) (Prodotto della ricerca)
• Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
• X-RAY-INDUCED REDUCTION EFFECTS AT CEO2 SURFACES - AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY (Articolo in rivista) (Prodotto della ricerca)